No Lie MRI, Inc. has the exclusive worldwide rights to the following patent application:

Patent Title of Invention: "Functional Brain Imaging For Detecting And Assessing Deception And Concealed Recognition, and Cognitive/Emotional Response To Information"
Patent Application: The Trustees of the University of Pennsylvania
Patent Inventor: Dr. Daniel Langleben
US Publication Number: US-2005-0154290-A1
International Patent Number: WO 02/102238 A2

This patent is the cornerstone for the No Lie MRI technology. The totally automated product allows for low cost of goods sold and realtime analysis of results.

The patent application also covers No Lie MRI's second product, the recognition of a face by the interviewee.

Note that the emerging technology of Near Infrared Spectroscopy (NIR) is also covered under the patent.

No Lie MRI, Inc. also has exclusive commercial access to proprietary databases.